How Reduced Data Precision and Degree of Parallelism Impact the Reliability of Convolutional Neural Networks on FPGAs

Authors

F. Libano, P. Rech, B. Neuman, J. Leavitt, M. Wirthlin, J. Brunhaver

Conference/Journal Information

IEEE Transactions on Nuclear Science

Date

May 2021

DOI/Conference Number

10.1109/TNS.2021.3050707

View/Download

Year

2021

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