SRAM FPGA Reliability Analysis for Harsh Radiation Environments

Additional Citation Information
IEEE Transactions on Nuclear Science (TNS), Vol. 56, No. 6, Dec. 2009, pp. 3519-3526
Authors
P. Ostler, M. Caffrey, D. Gibelyou, P. Graham, K. Morgan, B. Pratt, H. Quinn, and M. Wirthlin
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Year
2009