Using partial duplication with compare to detect radiation-induced failure in a commercial FPGA-Based networking system

Authors

A. Keller, J. Anderson, M. Wirthlin, S. Wen, R. Fung, C. Chambers

Conference/Journal Information

2020 IEEE International Reliability Physics Symposium (IRPS)

Date

Apr. 28-May 30, 2020

DOI/Conference Number

10.1109/IRPS45951.2020.9128839

View/Download

Year

2020

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